IPM workshop on Future Hardware Development at CERN

Asia/Tehran
Institute for Research in Fundamental Sciences

Institute for Research in Fundamental Sciences

IPM, Apposite the Araj, Artesh Highway, Tehran
Mohsen Khakzad (IPM)
Description
The goal of the workshop is to introduce the current and the future developing of electronic readout with a vast applications from High Energy physics to medical applications. The Fast Track Trigger ( (FTK) project for future pixels development on both ATLAS and CMS is illustrated. We also identify IPM and INFN collaborations on detector and the readout developments.
  • Monday 18 January
    • Workshop Opening and Introduction
      • 1
        Workshop Opening
        Speakers: Hessamaddin Arfaei (IPM), Mohsen Khakzad (IPM)
      • 2
        Presentation of Milano group: Activites and Collaborations
        Speaker: Valentino Liberali
    • 10:15
      Coffee Break
    • Physics and Electronics Backgrounds
      • 3
        CMOS technology: logic families, power/speed/area trade-off, scaling and Moore's Law
        Speaker: Valentino Liberali
    • 12:45
      Lunch Time
    • Detector Design Basics
      • 4
        Logic design approaches: full-custom, standard cells, IP block
        Speaker: Alberto Stabile
    • 15:30
      Coffee Break
    • Radiation Effects
      • 5
        Radiation effects on CMOS: theoretical aspects, models, and design guidelines
        Speaker: Seyed Ruhollah Shojaii
    • IPM Activities
      • 6
        CT-PPS Collaborations
        Speaker: Mohsen Khakzad (IPM)
      • 7
        IPM Electronic Collaborations
        Speaker: Alireza Kokabi (IPM)
      • 8
        IPM Detector Collaborations
        Speaker: Hadi Behnamian (IPM)
  • Tuesday 19 January
    • Detector Technology
      • 9
        Pixel design in BCD technology
        Speaker: Valentino Liberali
      • 10
        Innovative Associative Memory (AM) chips for Fast Tracker Processors
        Speaker: Alberto Stabile
    • 11:00
      Coffee Break
    • Test and Charaterization
      • 11
        Test and design for testability: JTAG, BIST
        Speaker: Valentino Liberali
    • 12:30
      Lunch Time
    • Test and Characterization
      • 12
        Characterization of the AM06 chip
        Speaker: Seyed Ruhollah Shojaii
      • 13
        Innovative Multi-chip system for multi-purpose Pattern Recognition Tasks
        Speaker: Alberto Stabile
    • Round Table and Discussions