27–28 Apr 2016
Qazvin Science & Technology Park
Asia/Tehran timezone

The effect of scintillator thickness on afterglow in scintillation X-ray detectors

Not scheduled
15m
Rajaee Conference Hall (Qazvin Science & Technology Park)

Rajaee Conference Hall

Qazvin Science & Technology Park

Parajin rd. - Nokhbegan blvd. - Janbazan sq. - QAZVIN - IRAN
Poster Presentation

Speaker

Mr Karim Zarei (University of Antwerp)

Description

Solid-state scintillation detectors are widely used in modern multi-slice CT systems as well as synchrotron micro-tomography beamlines. Amongst other parameters, the performance of these detectors depends on the thickness of the scintillator. Thicker scintillators result in higher emission intensities, yet the resolution deteriorates as the thickness increases. To achieve a higher scan speed, thicker scintillators are more common. The thickness of scintillators however may influence the afterglow. In this paper, we investigate the effect of scintillator thickness on the afterglow, using LuAG:Ce (LAG) scintillator with different thicknesses. Experimental results show that, apart from the scintillator material and excitation condition, the thickness of scintillator has a decisive role on the scintillator decay and particularly on the afterglow.

Author

Mr Karim Zarei (University of Antwerp)

Presentation materials

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