Speaker
Dr
Saeid Asgharizadeh
(research institue of applied physics and astronomy)
Description
The X-rays interaction with matter can be described by an index of refraction which is less than one and characterizes the change of direction of the X-ray beam when passing from air to material. The value of the parameters in the index of refraction depend on the electron density and linear absorption coefficient. An index of refraction less than one causes a total reflection when X-ray interact with surfaces. Evaluating the critical angle due to the total reflection will provide average density of the layer. Dynamical and kinematical scattering theories will play role to discover thickness and roughness parameters of the surfaces (in layers) and interfaces (in multilayer systems).
