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Silicon drift detectors (SDDs) are X-ray radiation detectors used in high count rate x-ray spectrometry (EDS) and electron microscopy. An SDD has less electronic noise than a comparable planar detector, particularly at short peaking times. This gives the SDD better energy resolution at moderate count rates and much better energy resolution at high count rates. SDDs are used in large quantities on industrial scale in applications like electron microscopy (SEM-EDX) and X-ray fluorescence analysis (XRF).
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