Beam Profile and Emittance Measurement
Sunday, 2 July 2017 -
14:00
Monday, 26 June 2017
Tuesday, 27 June 2017
Wednesday, 28 June 2017
Thursday, 29 June 2017
Friday, 30 June 2017
Saturday, 1 July 2017
Sunday, 2 July 2017
14:00
Resolution limits of beam profile measurement; Optical system
14:00 - 14:30
Room: Seminar Room
14:30
Resolution limits of beam profile measurement; Scintillator view screen
14:30 - 15:00
Room: Seminar Room
15:00
Error propagation studies in Sol-Scan emittance measurement process
15:00 - 15:30
Room: Seminar Room