Speaker
Dr
Okhtay Jahanbakhsh
(University of Tabriz)
Description
Interaction of charged particles in a detector, can cause ionization and excitation of the atoms and molecules. Secondary ionization (electron avalanche inside a gaseous detector and its output signal) strongly depended to primary ionization, and primary ionization is a complicated function of the type and energy of incident particle and physical property of target material. In this study using HEED and GARFIELD++ codes, the details of primary ionization properties (energy loss and average number of primary produced electrons and clusters) for different type of incident particles with different energy and different entrance angle have been investigated. The results show that the number of primary produced electrons and clusters, and energy loss of the particle increase with increasing the energy and entrance angle of the incident particles. These increases aren’t a linear function of particle energy and there are a minimum and a maximum point
Author
Dr
Okhtay Jahanbakhsh
(University of Tabriz)
Co-author
Mr
mohammad ali tourani
(University of Tabriz)
